ISTFA '98 : Proceedings of the 24th International Symposium for Testing and Failure Analysis: 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas
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| Title: | ISTFA '98 : Proceedings of the 24th International Symposium for Testing and Failure Analysis: 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas |
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| Description: | This volume presents the latest information from international specialists in the testing and failure analysis of microelectronic devices. The papers included discuss new aspects of the procedures used to assure the quality of these devices that form the heart of modern control and communication equipment as well as the established practices used in this important field. |
| Authors: | ASM International |
| Resource Type: | eBook. |
| Subjects: | Electronics--Materials--Testing--Congresses, Electronic apparatus and appliances--Testing--Congresses |
| Categories: | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General, TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated |
| Database: | eBook Collection (EBSCOhost) |
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