ISTFA 2007 : Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA
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| Title: | ISTFA 2007 : Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA |
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| Description: | This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results. |
| Authors: | Electronic Device Failure Analysis Society, ASM International |
| Resource Type: | eBook. |
| Subjects: | Electronics--Materials--Testing--Congresses, Electronic apparatus and appliances--Testing--Congresses |
| Categories: | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General, TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated |
| Database: | eBook Collection (EBSCOhost) |
| Abstract: | This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results. |
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| ISBN: | 9780871708632 9781615030903 |
