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ISTFA 2007 : Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA

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Title: ISTFA 2007 : Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA
Description: This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Authors: Electronic Device Failure Analysis Society, ASM International
Resource Type: eBook.
Subjects: Electronics--Materials--Testing--Congresses, Electronic apparatus and appliances--Testing--Congresses
Categories: TECHNOLOGY & ENGINEERING / Electronics / Circuits / General, TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated
Database: eBook Collection (EBSCOhost)
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  Data: ISTFA 2007 : Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA
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  Data: This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
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      – Code: eng
        Text: English
    Subjects:
      – SubjectFull: Electronics--Materials--Testing--Congresses
        Type: general
      – SubjectFull: Electronic apparatus and appliances--Testing--Congresses
        Type: general
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      – TitleFull: ISTFA 2007 : Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA
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