Defects-Recognition, Imaging and Physics in Semiconductors XIV
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| Title: | Defects-Recognition, Imaging and Physics in Semiconductors XIV |
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| Description: | Selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP-14), September 25-29, 2011, Miyazaki, Japan |
| Authors: | Hiroshi Yamada-Kaneta, Akira Sakai |
| Resource Type: | eBook. |
| Subjects: | Semiconductors--Defects--Congresses, Image processing--Congresses |
| Categories: | TECHNOLOGY & ENGINEERING / Materials Science / General |
| Database: | eBook Collection (EBSCOhost) |
| Abstract: | Selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP-14), September 25-29, 2011, Miyazaki, Japan |
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| ISBN: | 9783037854426 9783038138563 |
