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Defects-Recognition, Imaging and Physics in Semiconductors XIV

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Title: Defects-Recognition, Imaging and Physics in Semiconductors XIV
Description: Selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP-14), September 25-29, 2011, Miyazaki, Japan
Authors: Hiroshi Yamada-Kaneta, Akira Sakai
Resource Type: eBook.
Subjects: Semiconductors--Defects--Congresses, Image processing--Congresses
Categories: TECHNOLOGY & ENGINEERING / Materials Science / General
Database: eBook Collection (EBSCOhost)
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PubType: eBook
PubTypeId: ebook
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  Data: Selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP-14), September 25-29, 2011, Miyazaki, Japan
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  Data: <searchLink fieldCode="AR" term="%22Hiroshi+Yamada-Kaneta%22">Hiroshi Yamada-Kaneta</searchLink><br /><searchLink fieldCode="AR" term="%22Akira+Sakai%22">Akira Sakai</searchLink>
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      – Code: 621.38152
        Scheme: ddc
        Type: prePub
    Languages:
      – Code: eng
        Text: English
    Subjects:
      – SubjectFull: Semiconductors--Defects--Congresses
        Type: general
      – SubjectFull: Image processing--Congresses
        Type: general
    Titles:
      – TitleFull: Defects-Recognition, Imaging and Physics in Semiconductors XIV
        Type: main
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      – PersonEntity:
          Name:
            NameFull: Hiroshi Yamada-Kaneta
      – PersonEntity:
          Name:
            NameFull: Akira Sakai
      – PersonEntity:
          Name:
            NameFull: Hiroshi Yamada-Kaneta
      – PersonEntity:
          Name:
            NameFull: Akira Sakai
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          Dates:
            – D: 01
              M: 01
              Type: published
              Y: 2012
            – D: 04
              M: 02
              Type: profile
              Y: 2014
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              Value: 9783037854426
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              Value: 9783038138563
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              Value: 00725
          Titles:
            – TitleFull: Defects-Recognition, Imaging and Physics in Semiconductors XIV
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