Reliable Technology Evaluation of SiGe HBTs and MOSFETs: fMAX Estimation From Measured Data.
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| Title: | Reliable Technology Evaluation of SiGe HBTs and MOSFETs: fMAX Estimation From Measured Data. |
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| Authors: | Saha, Bishwadeep1, bishwadeep.saha@ims-bordeaux.fr, Fregonese, Sebastien2, Heinemann, Bernd3, Scheer, Patrick4, Chevalier, Pascal4, Aufinger, Klaus5, Chakravorty, Anjan6, Zimmer, Thomas2 |
| Source: | IEEE Electron Device Letters; Jan2021, Vol. 42 Issue 1, p14-17, 4p |
| Database: | Applied Science & Technology Source |
| ISSN: | 07413106 |
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| DOI: | 10.1109/LED.2020.3040891 |
