Effect of the Compliance Current on the Retention Time of Cu/HfO2-Based Memristive Devices.
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| Title: | Effect of the Compliance Current on the Retention Time of Cu/HfO2-Based Memristive Devices. |
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| Authors: | Humood, Khaled1, Saylan, Sueda1, Mohammad, Baker1, baker.mohammad@ku.ac.ae, Abi Jaoude, Maguy2 |
| Source: | Journal of Electronic Materials; Aug2021, Vol. 50 Issue 8, p4397-4406, 10p |
| Database: | Applied Science & Technology Source |
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