Performance and variability analysis of ALD-grown wafer scale HfO2/Ta2O5-based memristive devices for neuromorphic computing.
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| Title: | Performance and variability analysis of ALD-grown wafer scale HfO2/Ta2O5-based memristive devices for neuromorphic computing. |
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| Authors: | Kumar, Sanjay1,2, sanjaysihag91@gmail.com, Yadav, Deepika1, Stathopoulos, Spyros1, Prodromakis, Themis1, sanjaysihag91@gmail.com |
| Source: | Frontiers in Nanotechnology (2673-3013); 2025, p1-12, 12p |
| Database: | Applied Science & Technology Source |
| ISSN: | 26733013 |
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| DOI: | 10.3389/fnano.2025.1621554 |
