A Compact Time-Domain Reflectometry (TDR)-Based Microwave Nondestructive Testing Circuit.

Saved in:

Bibliographic Details
Title:	A Compact Time-Domain Reflectometry (TDR)-Based Microwave Nondestructive Testing Circuit.
Authors:	Shaaban, Nadine A.¹, Jawad, Ghassan N.¹, ghassan.jawad@coeng.uobaghdad.edu.iq
Source:	Progress in Electromagnetics Research C; 2026, Vol. 164, p263-270, 8p
Database:	Applied Science & Technology Source

Description
ISSN:	19378718
DOI:	10.2528/PIERC25071008