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A Compact Time-Domain Reflectometry (TDR)-Based Microwave Nondestructive Testing Circuit.

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Bibliographic Details
Title: A Compact Time-Domain Reflectometry (TDR)-Based Microwave Nondestructive Testing Circuit.
Authors: Shaaban, Nadine A.1, Jawad, Ghassan N.1, ghassan.jawad@coeng.uobaghdad.edu.iq
Source: Progress in Electromagnetics Research C; 2026, Vol. 164, p263-270, 8p
Database: Applied Science & Technology Source
Description
ISSN:19378718
DOI:10.2528/PIERC25071008