Data management and visualization of x-ray diffraction spectra from thin film ternary composition spreads.
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| Title: | Data management and visualization of x-ray diffraction spectra from thin film ternary composition spreads. |
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| Authors: | Takeuchi, I., Long, C. J., Famodu, O. O. |
| Source: | Review of Scientific Instruments; June 2005, Vol. 76 Issue 6, p062223-062223, 1p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00346748 |
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| DOI: | 10.1063/1.1927079 |
