View in EDS

Measuring the specific contact resistance of contacts to semiconductor nanowires.

Saved in:
Bibliographic Details
Title: Measuring the specific contact resistance of contacts to semiconductor nanowires.
Authors: Mohney, S. E., Wang, Y., Cabassi, M. A.
Source: Solid-State Electronics; February 2005, Vol. 49 Issue 2, p227-232, 6p
Database: Applied Science & Technology Source
Be the first to leave a comment!
You must be logged in first