Electrical Characterization of n-Type Polycrystalline 3C-Silicon Carbide Thin Films Deposited by 1,3-Disilabutane.

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Bibliographic Details
Title: Electrical Characterization of n-Type Polycrystalline 3C-Silicon Carbide Thin Films Deposited by 1,3-Disilabutane.
Authors: Zhang, Jingchun, Howe, Roger T., Maboudian, Roya
Source: Journal of the Electrochemical Society; 2006, Vol. 153 Issue 6, pG548-G551, 4p
Database: Applied Science & Technology Source
Description
ISSN:00134651
DOI:10.1149/1.2188327