Damage to the silicon lattice by reactive ion etching.

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Bibliographic Details
Title: Damage to the silicon lattice by reactive ion etching.
Authors: Strunk, H. P., Cerva, H., Mohr, E. G.
Source: Journal of the Electrochemical Society; November 1988, Vol. 135, p2876-2880, 5p
Database: Applied Science & Technology Source
Description
ISSN:00134651
DOI:10.1149/1.2095452