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Scheme for designing concurrent checking and easily testable PLAs.

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Bibliographic Details
Title: Scheme for designing concurrent checking and easily testable PLAs.
Authors: Tao, D. L., Lala, P. K., Hartmann, C. R. P.
Source: IEE Proceedings. Part E, Computers & Digital Techniques.; November 1990, Vol. 137, p442-450, 9p
Database: Applied Science & Technology Source
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