Measurement of wavelength-dependent radiation pressure from photon reflection and absorption due to thin film interference.
Saved in:
| Title: | Measurement of wavelength-dependent radiation pressure from photon reflection and absorption due to thin film interference. |
|---|---|
| Authors: | Ma, Dakang1,2, Munday, Jeremy N.1,2 jnmunday@umd.edu |
| Source: | Scientific Reports. 10/29/2018, Vol. 8 Issue 1, p1-1. 1p. |
| Database: | Academic Search Ultimate |
|
Full text is not displayed to guests.
Login for full access.
|
|
Be the first to leave a comment!