Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniques.
Saved in:
| Title: | Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniques. |
|---|---|
| Authors: | Gallagher, James C.1 (AUTHOR) james.gallagher@nrl.navy.mil, Ebrish, Mona A.2 (AUTHOR), Porter, Matthew A.3 (AUTHOR), Jacobs, Alan G.2 (AUTHOR), Gunning, Brendan P.4 (AUTHOR), Kaplar, Robert J.4 (AUTHOR), Hobart, Karl D.1 (AUTHOR), Anderson, Travis J.1 (AUTHOR) |
| Source: | Scientific Reports. 1/13/2022, Vol. 12 Issue 1, p1-8. 8p. |
| Database: | Academic Search Ultimate |
|
Full text is not displayed to guests.
Login for full access.
|
|
Be the first to leave a comment!
