A Novel Technique of Extracting UCN Decay Lifetime from Storage Chamber Measurements Dominated by Scattering Losses.
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| Title: | A Novel Technique of Extracting UCN Decay Lifetime from Storage Chamber Measurements Dominated by Scattering Losses. |
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| Authors: | Mohanmurthy, Prajwal1,2 (AUTHOR) prajwal@alum.mit.edu, Formaggio, Joseph2 (AUTHOR), Salvat, Daniel J.3 (AUTHOR), Winger, Jeff A.4 (AUTHOR) prajwal@alum.mit.edu |
| Source: | Symmetry (20738994). Oct2023, Vol. 15 Issue 10, p1899. 19p. |
| Database: | Academic Search Ultimate |
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